MIL-STD-981 Design, Manufacturing And Quality Standards For Custom Electromagnetic Devices For Space Applications

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MIL-STD-981C

5.6.7.3.8 Radio frequency, fixed and variable, chip coils (families 50 and 51, respectively). These devices shall be subjected to the group A screening tests in TABLE Ix.

TABLE Ix. Group A screening tests for families 50 and 51 (see 5.6.7.3.8).

Examination/Test

Class

Applicable Military

Specification

Inspection

Subgroup I Thermal shock

No-load Burn-in

Dielectric withstanding voltage Insulation resistance Inductance

Self resonant frequency DC resistance Radiographic inspection

x x x x x x x x x

x x x x x x x x

See 5.6.7.3.8.1

See 5.6.7.3.8.2

MIL-PRF-83446

See Appendix B

100 percent

Subgroup II Visual and dimensional

examination (external)

MIL-PRF-83446

100 percent

1/ When specified.

5.6.7.3.8.1 Thermal shock. Thermal shock screening shall be in accordance with MIL-PRF-83446, and as follows:

a. Number of cycles: 25

b. Continually monitor continuity during the entire final cycle to verify no intermittent conditions.

Continuity monitoring current shall not exceed 100 microamperes. Equipment shall be capable of detecting intermittent opens exceeding 100 microseconds.

c. Class S parts using magnet wire smaller than AWG 38 shall have DC resistance measured before and after the thermal shock screen. The change in resistance shall not exceed ±3 percent.

5.6.7.3.8.2 No-load burn-in.

a. Test duration: 96 hours minimum.

b. Test temperature: Maximum rated operating temperature. (See applicable specification)

c. Test voltage: Not applicable.