MIL-STD-981C
Table XIV. Group B tests for RF Chip Coils (families 50 and 51) (see 5.6.7.4).
Test 1/ |
Class S |
|
Sample Size |
Defective units allowed |
|
Subgroup 1 Electrical characteristics (initial) 2/ Low temperature operation Temperature rise Overload Moisture resistance Electrical characteristics Inductance Q High temperature exposure Electrical characteristics (final) 2/ Turning torque (when applicable) Bond strength Visual and mechanical examination (external) Visual and mechanical examination (internal)(one Sample) 3/ |
2 |
0 |
Subgroup 2 Solderability Electrical characteristics (initial) 2/ Life Dielectric withstanding voltage (at reduced voltage) Insulation resistance Electrical characteristics (final) 2/ Visual and mechanical examination (external) |
2 |
0 |
1/ Specified tests shall be performed in accordance with MIL-PRF-83446
2/ All measurements are made with sample devices mounted on substrates.
3/ Real time x-ray is an acceptable method of examination in lieu of dissection or disassembly.
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